Burn-in sorter and sorting method using the same

Details Burn-in sorter and sorting method using the same Burn-in sorter and sorting method using the same

2007-06-12

2009-06-02

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S760020, C324S1540PB

Reexamination Certificate

active

07541828

ABSTRACT:
Provided is an apparatus for sorting burn-in tested packaged chips, including a DC test unit performing a DC test on packaged chips, a DC failure/loading head moving in a first direction to load packaged chips onto the DC test unit, and an inserting head moving in a second direction perpendicular to the first direction to transfer DC test-passed packaged chips from the DC test unit to a burn-in board, wherein the DC test unit is moved in the second direction, close to the DC failure/loading head when loading the packaged chips onto the DC test unit and close to the inserting head when transferring the packaged chips to the burn-in board, to sort burn-in tested packaged chips. The structure in which the DC test unit is movable toward the DC failure/loading head and the inserting head makes it possible to reduce the distance which the heads have to travel and to prevent the DC failure/loading head and the inserting head from interfering with each other.

REFERENCES:
patent: 3969229 (1976-07-01), Horner
patent: 6209194 (2001-04-01), Kang
patent: 6239396 (2001-05-01), Kang
patent: 6323669 (2001-11-01), Kang
patent: 6563331 (2003-05-01), Maeng
patent: 6882141 (2005-04-01), Kim
patent: 2005/0062463 (2005-03-01), Kim

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