Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-12-23
1996-01-23
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
439 70, G01R 3102, H05K 102
Patent
active
054867711
ABSTRACT:
This invention is directed to a mechanical, robotically operated burn-in socket testing apparatus for integrated circuit "chips", where such chips, as known in the art, are typically planar electronic devices. The apparatus, operationally mounted to a planar electronic board, such as a mother board, comprises a first frame member for mounting to the mother board, where the first frame member includes electrical means for engaging chip leads and applying electrical current thereto during the burn-in testing. A second frame member is disposed in sliding engagement with the first frame member, where the second frame member is movable from a first position to a second position. Finally, cooperative latching and camming means are provided between the first and second frame members to effect the movement between the first and second positions, and to securely hold the chip during burn-in, where the camming means includes a pivotal member movable from a remote position free of the chip to a position engaging the chip.
REFERENCES:
patent: 4498047 (1985-02-01), Hexamer et al.
patent: 4779047 (1988-10-01), Solstad et al.
patent: 5100332 (1992-03-01), Egawa
patent: 5120238 (1992-06-01), Marks et al.
Deak Frederick R.
Irlbeck Robert D.
Johnson David C.
Renn Robert M.
Volz Keith L.
Aberle Timothy J.
Bowser Barry C.
Whitaker Corporation
Wieder Kenneth A.
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