Burn-in board having discrete test capability

Details Burn-in board having discrete test capability Burn-in board having discrete test capability

1988-05-02

1990-05-15

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158P, G01R 3102, G01R 106

Patent

active

049261177

ABSTRACT:
A two-piece burn-in board is used in semiconductor testing. The board can be disassembled so that it has ability to act as a device carrier wherein each individual device is completely isolated and as a standard burn-in board wherein all devices share the common signals. This ability to isolate or combine signals makes the board useable for functional device test/characterization and burn-in.

REFERENCES:
patent: 4713611 (1987-12-01), Solstad et al.
patent: 4749945 (1988-06-01), Bonifert et al.
patent: 4757255 (1988-07-01), Margozzi

Affiliated with

Also associated with

Rating

Burn-in board having discrete test capability does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Burn-in board having discrete test capability, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Burn-in board having discrete test capability will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-623464