Burn-in apparatus for semiconductor integrated device

Details Burn-in apparatus for semiconductor integrated device Burn-in apparatus for semiconductor integrated device

1992-07-13

1994-07-12

Reynolds, Bruce

Electric heating

Heating devices

Combined with diverse-type art device

324537, H05B 100

Patent

active

053290933

ABSTRACT:
The burn-in apparatus according to the present invention comprises a fixing unit for accommodating and fixing a plurality of semiconductor integrated devices and a unit for accommodating the fixing unit with the devices so as to keep a thermal condition therein. The fixing unit and the unit for accommodating the fixing unit are combined as one body to be carryable. The apparatus further comprises a unit for connecting the semiconductor integrated devices with a power supply disposed outside of the apparatus. When a burn-in test is conducted, the fixing unit and the unit for accommodating the fixing unit are combined as one body, and this combined body is fitted with a connector. After the burn-in test is finished, by detaching the unit for accommodating the fixing unit, the fixing unit can be used as trays for conveying the devices to the next test process.

REFERENCES:
patent: 4777434 (1988-10-01), Miller et al.
patent: 4926117 (1990-05-01), Nevill
patent: 4978914 (1990-12-01), Akimoto et al.
patent: 5126656 (1992-06-01), Jones
patent: 5180974 (1993-01-01), Mitchell et al.
patent: 5200885 (1993-04-01), Hamilton et al.

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