Burn-in apparatus

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324158P, 324158R, G01R 100, G01R 102

Patent

active

050217330

ABSTRACT:
A burn-in apparatus includes burn-in boards for holding semiconductor devices through air suction and for electrically connecting them to external equipment. Since the semiconductor devices are held on the burn-in boards for electrical connection through air suction, sockets are not necessary to hold them on the boards which reduces costs. Further, the leads of semiconductor devices, which have conventionally been susceptible to bending when inserted into or extracted from the sockets, can be protected.

REFERENCES:
patent: 3710251 (1973-01-01), Hagge et al.
patent: 4713611 (1987-12-01), Solstad et al.
patent: 4799021 (1989-01-01), Cozzi
"Carrier Card Assembly for Component Aging", by Bruder et al., IBM Tech. Disc. Bull., vol. 14, #3 8/71; p. 737.
"Novel Variable-Temperature Chuck for Use in the Detection of Deep Levels in Processed Semiconductor Wafers", by Koyamo et al.; Rev. Sci. Instrum., Am. Insti. of Phys., 8/79, pp. 983-987, vol. 50, #8.

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