Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1992-07-21
1995-03-14
Noland, Tom
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
340652, B25J 2100, G01R 3128
Patent
active
053979982
ABSTRACT:
A burn-in apparatus wherein products can be checked during burn-in to determine whether or not a respective product will fail completely during burn-in or whether the product will operate unstably during burn-in. The burn-in apparatus includes a burn-in chamber which burns in a product placed therein. A product carry-in automatic conveyer carries products into the burn-in chamber and a product carry-out automatic conveyor carries products out of the burn-in chamber. An air conditioning unit adjusts the temperature of air inside the burn-in chamber. A product testing section, extending between the outside and the inside of the burn-in chamber, holds and provides electrical power to a product during burn in. Testing equipment is provided outside the burn-in chamber and connects to a product held by the product testing section so that the product can be tested during burn in. A burn-in storage, provided inside said burn-in chamber, receives a product and provides electrical power thereto until the product is to be tested. A product moving mechanism transports a product to be tested from the burn-in storage to the product testing section and automatically moves a product among the product carry-in automatic conveyor, the product carry-out automatic conveyor, the burn-in storage and the product testing section.
REFERENCES:
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patent: 4636726 (1987-01-01), Santomango et al.
patent: 4745354 (1988-05-01), Fraser
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IBM Technical Disclosure Bulletin: vol. 9, No. 3 Aug. 1966, pp. 240-241, "Test Component Handler", by S. I. Bruder et al; vol. 14, No. 4, Sep. 1971 p. 1035, Pallet Transport and Conditioner, by B. C. Ruse et al; and vol. 20, No. 5, Oct. 1977 pp. 1837-1838, Environment Test Chamber for Circuit Card, by J. S. Hanson (all 3 references found in 324/158 F).
Oide Hiroshi
Soeno Shigeru
Fujitsu Limited
Noland Tom
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