Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Reexamination Certificate
2007-12-18
2007-12-18
Huynh, Phuong (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Chemical analysis
C702S123000, C702S124000, C702S126000, C702S182000, C702S189000, C356S326000, C356S328000, C250S339050
Reexamination Certificate
active
11474477
ABSTRACT:
A real-time bulk material analyzing system is disclosed for analyzing the elemental characteristics of bulk material passing by the system on a moving conveyor belt. An exemplary embodiment includes a source of illumination emitting white light for exciting bulk material to be analyzed, and a hyperspectral imaging spectrometer for capturing spectral reflectance from bulk material excited by the illumination source. A non-hazardous source of excitation can be used, which allows the bulk material to pass unobstructed and undisturbed through the detector array.
REFERENCES:
patent: 4508573 (1985-04-01), Harris
patent: 4799880 (1989-01-01), McCoy
patent: 4976540 (1990-12-01), Kitamura et al.
patent: 5754423 (1998-05-01), Teutenberg et al.
patent: 6160618 (2000-12-01), Garner
patent: 6491751 (2002-12-01), Watson
patent: 6709510 (2004-03-01), Young et al.
patent: 6771369 (2004-08-01), Rzasa et al.
patent: 2003/0123056 (2003-07-01), Barnes et al.
patent: 2004/0031335 (2004-02-01), Fromme et al.
patent: 2004/0207842 (2004-10-01), Rzasa et al.
patent: 2004/0232339 (2004-11-01), Lanoue
patent: 2005/0077471 (2005-04-01), Edwards et al.
patent: WO 02/065072 (2002-08-01), None
patent: WO 02/065100 (2002-08-01), None
patent: WO 02/065101 (2002-08-01), None
patent: WO 02/065102 (2002-08-01), None
patent: WO 2002/088811 (2002-11-01), None
patent: WO 2004/106874 (2004-12-01), None
patent: WO 2004106874 (2004-12-01), None
patent: WO 2006/054154 (2006-05-01), None
patent: WO 2006054154 (2006-05-01), None
European Search Report; Oct. 6, 2006; 7 Pages.
Advanced Spaceborne Thermal Emission and Reflection Radiometer; ASTER (Japanese Ministry of Economy, Trade and Industry and NASA); www.asterweb.jpl.nasa.gov; 83 pages.
Analytical Spectral Devices, Inc.; Field Spectrometry: Techniques and Instrumentation; Boulder, Colorado; 2001; 9 pages.
Analytical Spectral Devices, Inc.; Identification of raw materials by NIR reflectance; Boulder, Colorado; www.asdi.com; 8 pages.
Analytical Spectral Devices, Inc.; Introduction to NIR Technology; Boulder, CO; www.asdi.com; 10 pages.
Analytical Spectral Devices, Inc.; NIR Analysis of White Powder Samples; Boulder, Colorado; www.asdi.com; 4 pages.
Analytical Spectral Devices, Inc; Quantitative Analysis of Concrete Samples Via NIR; Bolder, Colorado; www.asdi.com; 2004; 7 pages.
Clark, R. N.; Spectroscopy of Rocks and Minerals, and Principles of Spectroscopy, inManual of Remote Sensing, Chapter 1: vol. 3,Remote Sensing for the Earth Sciences, (A.N. Rencz, ed.) John Wiley and Sons, New York, p. 3-58, 1999; 67 pages.
CTR Carinthian Tech Research AG; Spectral Imaging Brochure; www.ctr.at; 2 pages.
Leetham, Darrell, et al.; Flexibility in Online Analysis; USA; www.thermo.com; 6 pages.
Perkinson, Maire-Claire et al.; Low Cost Hyperspectral Imaging From Space; England; 4 pages.
Stevens, Dave et al.; Recent Developments in Hyperspectral Imaging and their Significance as a New and Important Direct Exploration Tool; 26 pages.
ABB (Schweiz) AG
St. Onge Steward Johnston & Reens LLC
LandOfFree
Bulk material analyzer system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Bulk material analyzer system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Bulk material analyzer system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3841114