Built-in testing and transient avoidance for magnetic sensors

Details Built-in testing and transient avoidance for magnetic sensors Built-in testing and transient avoidance for magnetic sensors

2010-02-20

2010-10-19

LeDynh, Bot L (Department: 2858)

Electricity: measuring and testing

Magnetic

Magnetometers

C324S261000

Reexamination Certificate

active

07816914

ABSTRACT:
A magnetic sensor assembly (100) uses printed circuit boards (PCB) (102) having a first surface (130) and an opposite, complementary second surface (132) to fabricate the sensor devices (104) and their associated processing circuitry. A trace or conductive element (106), or pair (108a, 108b) of complementary printed traces or conductor elements, on or within the board (102) are run beneath the magnetic sensor element (104), with the return trace or traces routed more remotely from the sensor (104).

REFERENCES:
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patent: 5837519 (1998-11-01), Savage et al.
patent: 7026812 (2006-04-01), Honkura et al.
patent: 2004/0108854 (2004-06-01), Nichols
patent: 2005/0140355 (2005-06-01), Yamada et al.
patent: 2006/0248964 (2006-11-01), McCoy
patent: 2007/0000622 (2007-01-01), Reed et al.
patent: 2007/0000684 (2007-01-01), Harada et al.

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