Built-in test circuit for testing AC transfer characteristic...

Details Built-in test circuit for testing AC transfer characteristic... Built-in test circuit for testing AC transfer characteristic...

2011-08-09

2011-08-09

Phan, Huy Q (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C324S762010, C324S500000, C327S108000, C327S333000

Reexamination Certificate

active

07994807

ABSTRACT:
An analog device under test circuit and a built-in test circuit for testing an AC transfer characteristic of the analog device under test are fabricated on an integrated circuit. The built-in test circuit includes an amplitude detector that detects the amplitude of the output signal of the analog device under test. The test time is reduced by sampling in real-time the DC value corresponding to the amplitude of the analog device under test. An additional reduction in the test time is achieved by using comparators with upper and lower limit reference signals and a pass-fail logic test.

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