Built-in self test method for application specific integrated ci

Details Built-in self test method for application specific integrated ci Built-in self test method for application specific integrated ci

1988-10-28

1990-08-14

Fleming, Michael R.

Excavating

371 226, G06F 1100

Patent

active

049493418

ABSTRACT:
A design and method of exhaustively verifying the boolean functionality of both combinational and sequential cells for Application Specific Integrted Circuit gate array and standard cell libraries is provided. A single integrated circuit includes a plurality of cells or macros from the library. A Gray code generator provides a plurality of Gray code signals to the cells in response to a binary counter. The binary and Gray code signals stimulate each state of each cell. A multiplexed output indicates the functionality of each state.

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