Built in self test method and circuit for parallel optical...

Details Built in self test method and circuit for parallel optical... Built in self test method and circuit for parallel optical...

2005-08-09

2005-08-09

Phan, Hanh (Department: 2633)

Optical communications

Diagnostic testing

Fault detection

C398S182000, C398S186000, C398S194000, C398S195000, C398S196000, C398S197000, C398S009000, C398S010000, C398S016000, C398S017000, C398S022000, C398S027000, C375S221000, C375S219000, C375S224000, C365S201000, C714S733000, C714S738000, C714S739000

Reexamination Certificate

active

06928242

ABSTRACT:
An on-chip parallel data generator, including a Built In Self Test (BIST) generator, is integrated into a laser driver array of a parallel optical communication transmitter so that all optical outputs switch simultaneously. The BIST generator requires only one clock input which clocks the BIST generator for all channels. The optical outputs respond to either the on-chip BIST generator or the electrical inputs if a valid signal is present on the inputs.

REFERENCES:
patent: 6201829 (2001-03-01), Schneider
patent: 6480308 (2002-11-01), Yoshida et al.
patent: 6549310 (2003-04-01), Kuchta et al.
patent: 6564349 (2003-05-01), Mitten et al.
patent: 6567198 (2003-05-01), Kang

Affiliated with

Also associated with

Rating

Built in self test method and circuit for parallel optical... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Built in self test method and circuit for parallel optical..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Built in self test method and circuit for parallel optical... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3501342