Built-in self test indicator for an integrated circuit package

Details Built-in self test indicator for an integrated circuit package Built-in self test indicator for an integrated circuit package

1995-01-31

1996-10-29

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 96, 340514, G01R 3128

Patent

active

055700357

ABSTRACT:
Apparatus for providing a direct indication of the failure of an electronic ircuit including a built-in self test circuit which performs an initial test on the electronic circuit and having a visual indicator coupled thereto which becomes activated when the self test circuit senses a failure of the electronic circuit upon power being supplied thereto or during operation. The electronic circuit with the built-in test feature consists of an integrated circuit chip or a multi-chip module encapsulated in a package with the indicator means visible therethrough. The indicator consists either of a light emitting diode or fusible material which changes its appearance and becomes visible through the package upon being activated by the built-in self test circuit.

REFERENCES:
patent: 5268635 (1993-12-01), Bortolini et al.
patent: 5270655 (1993-12-01), Tomita

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