Built-in self-test global clock drive architecture

Details Built-in self-test global clock drive architecture Built-in self-test global clock drive architecture

1991-10-28

1996-07-02

Beausoliel, Jr., Robert W.

Excavating

371 221, H04B 1700

Patent

active

055330320

ABSTRACT:
A BIST clock driver for providing memory elements in a combinational and sequential logic circuit with a global clock signal during user mode and a test clock signal during testing. The clock driver also supplies clock signals to memory circuits that have clock inputs supplied by random logic. The clock driver supplies the random logic with a global clock signal. A clock multiplexor receives the generated clock and the test clock signal and provides the memory element with the generated clock signal during user mode and the test clock during testing of the memory element.

REFERENCES:
patent: 4513418 (1985-04-01), Bardell, Jr. et al.
patent: 4669061 (1987-05-01), Bhaysar
patent: 4703484 (1987-10-01), Rolfe et al.
patent: 4894830 (1990-01-01), Kawai
patent: 5006787 (1991-04-01), Katircioglu et al.
patent: 5027355 (1991-06-01), Stoica
patent: 5029166 (1991-07-01), Jarwala et al.
patent: 5056094 (1991-10-01), Whetsel
patent: 5103167 (1992-04-01), Okano et al.
Stroud, "Automated BIST for Sequential Logic Synthesis" IEEE Design & Test of Computers, Dec. 1988, pp. 22-32.
"Automatic test generation for digital networks--some experimental results" Proc'72 summer computer simulation conf., Jun. 14-16, San Diego, CA. by Simulation councils, Inc.
"Automatic tester for PC boards using fault injection simulation" Pro'72 summer computer simulation Conf., Jun. 14-16, San Diego, Ca. by simulation councils, Inc.

Affiliated with

Also associated with

Rating

Built-in self-test global clock drive architecture does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Built-in self-test global clock drive architecture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Built-in self-test global clock drive architecture will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1513230