Built-in self-test circuitry for integrated circuits

Details Built-in self-test circuitry for integrated circuits Built-in self-test circuitry for integrated circuits

2006-02-28

2006-02-28

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07005875

ABSTRACT:
Circuits, methods, and apparatus for output response analyzers that may be used during integrated circuit testing. Current output test data is compared with previous output test data. In this way, repetitive test patterns such as checkerboards may be employed while limiting circuit complexity. The outputs of several built-in self-test circuits may be combined into as few as one signal that may be provided as a test output.

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patent: 6570426 (2003-05-01), Nakashimo
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