Built in full speed nonreturn to zero test method and...

Details Built in full speed nonreturn to zero test method and... Built in full speed nonreturn to zero test method and...

2007-06-26

2007-06-26

Korzuch, William (Department: 2627)

Dynamic magnetic information storage or retrieval

Monitoring or testing the progress of recording

C360S039000, C360S041000, C360S051000, C360S055000, C711S004000, C714S733000

Reexamination Certificate

active

10358656

ABSTRACT:
A data storage device such as a disc drive is described that has a controller chip with an integral embedded read/write channel on the chip. The chip includes a built in test capability for testing the controller logic via the device microprocessor and a nonreturn to zero test FIFO and control logic module. The module includes an internal first in/first out buffer (FIFO) that has variable data speeds and is provided on the chip to provide the test capability thereby permitting testing that would otherwise be difficult to perform.

REFERENCES:
patent: 4882671 (1989-11-01), Graham et al.
patent: 5812335 (1998-09-01), Kool et al.
patent: 5925144 (1999-07-01), Sebaa
patent: 6583942 (2003-06-01), Seng et al.

Affiliated with

Also associated with

Rating

Built in full speed nonreturn to zero test method and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Built in full speed nonreturn to zero test method and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Built in full speed nonreturn to zero test method and... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3865343