Built-in current testing of integrated circuits

Details Built-in current testing of integrated circuits Built-in current testing of integrated circuits

1990-02-22

1991-06-18

Deboer, Todd E.

Electricity: electrical systems and devices

Safety and protection of systems and devices

With specific voltage responsive fault sensor

361 42, 361 86, 361101, 340650, 324 731, 371 214, 371 225, H02H 316

Patent

active

050253441

ABSTRACT:
A built in current sensor on a unitary substrate with an integrated circuit is provided to sense abnormal quiescent current flow through the integrated circuit after a timing phase as an indication of defects such as shorts and open circuits, while ignoring normal high current peaks. A comparator is provided along with an adjustable reference current to provide a virtual ground voltage which represents that induced by a normal quiescent current through a fault-free integrated circuit. A breaker circuit may be provided for indication, or power disconnection of the integrated circuit, upon the occurrence of current flow above a predetermined value.

REFERENCES:
patent: 4354217 (1982-10-01), Mahon
patent: 4441136 (1984-04-01), Hampshire
patent: 4551779 (1985-11-01), Murakami et al.
patent: 4555742 (1985-11-01), Gray et al.
patent: 4646299 (1987-02-01), Schinabeck et al.
patent: 4704654 (1987-11-01), Aberleu et al.
patent: 4849847 (1989-07-01), McIver et al.

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