Buckling beam twist probe contactor assembly with spring biased

Details Buckling beam twist probe contactor assembly with spring biased Buckling beam twist probe contactor assembly with spring biased

1983-06-30

1985-05-21

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324158F, G01R 3102, G01R 106

Patent

active

045189102

ABSTRACT:
The buckling beam probe contactor assembly utilizing buckling beams in the form of continuous wires from the probe tips to remote source connectors includes at least one post terminating in a spring biased plunger assembly fixed to an underlying stripper plate provided with holes through which the beams project and protects them from damage. The stripper plate acts to accurately position the probe tips. The buckling beams intermediate their ends are potted in a slidable assembly axially movable on the post and shifted by an adjusting nut to preposition the probe tips relative to the stripper plate. The stripper plate first contacts the product during upward movement of the product, and the stripper plate is forced upwardly against spring bias relative to the post, then the beams contact the product test points and deflect a predetermined amount to maintain biased low ohmage circuit completions with the product.

REFERENCES:
patent: 3806801 (1974-04-01), Bove
patent: 4063172 (1977-12-01), Faure et al.
IBM Technical Disclosure Bulletin, vol. 15, No. 10, Mar. 1973, "Buckling Wire Probe Assembly" by L. D. Lipschutz et al., pp. 3032-3034.
IBM Technical Disclosure Bulletin, vol. 16, No. 5, Oct. 1973, p. 1366, "Buckling Beam Probe" by S. I. Bruder et al.
IBM Technical Disclosure Bulletin, vol. 17, No. 2, Jul. 1974, "Dual Buckling Beam Connectors for Test Probes" by S. I. Bruder et al., pp. 638-639.
IBM Technical Disclosure Bulletin, vol. 18, No. 8, Jan. 1976, "Test Probe" by L. H. Faure, pp. 2527-2528.

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