Buckling beam test probe assembly

Details Buckling beam test probe assembly Buckling beam test probe assembly

1985-06-03

1987-08-11

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324158F, G01R 106, G01R 3102

Patent

active

046864644

ABSTRACT:
The buckling beam probe contactor assembly comprises a number of square test probe arrays each containing a plurality of buckling beams in the form of continuous wires extending from the probe tips to a remote test apparatus. The buckling beams pass through an adjustable beam carrier block and through a number of guide plates which are kept in predetermined distances along the buckling beams by means of thin stabilizing rods arranged at the corners of the test probe array. The guide plates are inserted into grid-like frames which allow the arrangement of a plurality of test probe arrays close to each other wherein each array may contain test probes over its full area except for the locations occupied by the thin stabilizing rods.

REFERENCES:
patent: 3806801 (1974-04-01), Bove
patent: 4063172 (1977-12-01), Faure et al.
Bruder et al.; "Dual Beam . . . "; IBM Tech. Dis. Bull.; vol. 17; No. 2; Jul. 1974; pp. 638-639.

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