Buckling beam test probe assembly

Details Buckling beam test probe assembly Buckling beam test probe assembly

1994-03-10

1996-01-30

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 725, G01R 104, G01R 1073

Patent

active

054883148

ABSTRACT:
A buckling beam test probe assembly for the electrical test of integrated circuit devices is provided having contact probes made of a composite material and a stripper plate constructed so as to allow scrubbing and controllable wiping of the contact probe on the surface of the device to be tested. The assembly is designed for the maximum number of expected contact probes. Only the contact probe compartments which are needed for testing the devices are populated.

REFERENCES:
patent: 4816754 (1989-03-01), Buechele et al.
patent: 4843315 (1989-06-01), Bayer et al.
patent: 4901013 (1990-02-01), Benedetto et al.
patent: 5066907 (1991-11-01), Tarzwell et al.
patent: 5175496 (1992-12-01), Collins et al.

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