Bubble memory optimization by adjusting properties of quartz fil

Details Bubble memory optimization by adjusting properties of quartz fil Bubble memory optimization by adjusting properties of quartz fil

1977-10-05

1981-06-09

Pianalto, Bernard D.

Chemistry: electrical and wave energy

Processes and products

Vacuum arc discharge coating

427131, 427132, C23C 1500

Patent

active

042723477

ABSTRACT:
A bubble memory device and method of fabrication are disclosed which establish that there is a correlation between bubble memory performance and the properties of a quartz film, which is interposed between the bubble film and metallic overlays, namely, the permalloy and/or conductor layers of the device. Specifically, it has been established that there is a correlation between improved device performance and a low p-etch rate which is a measurement that establishes certain elastic constants of the quartz (i.e., the response of the device to stress).

REFERENCES:
Dishman et al., J.O.A.P. U45 No. 9, 4076, 9-74.

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