Bubble memory optimization by adjusting properties of quartz fil

Details Bubble memory optimization by adjusting properties of quartz fil Bubble memory optimization by adjusting properties of quartz fil

1980-06-11

1981-09-22

Pianalto, Bernard D.

Stock material or miscellaneous articles

Web or sheet containing structurally defined element or...

Physical dimension specified

204192D, 428433, 428448, 428450, 428457, 428692, 428697, 428702, 428900, B32B 904

Patent

active

042910919

ABSTRACT:
A bubble memory device and method of fabrication are disclosed which establish that there is a correlation between bubble memory performance and the properties of a quartz film, which is interposed between the bubble film and metallic overlays, namely, the permalloy and/or conductor layers of the device. Specifically, it has been established that there is a correlation between improved device performance and a low p-etch rate which is a measurement that establishes certain elastic constants of the quartz (i.e., the response of the device to stress).

REFERENCES:
patent: 4172758 (1979-10-01), Bailey et al.

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