Broadside compare with retest on fail

Details Broadside compare with retest on fail Broadside compare with retest on fail

2006-04-11

2006-04-11

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S118000, C324S761010

Reexamination Certificate

active

07027946

ABSTRACT:
A tester routine is provided that evaluates multiple test pins, on multiple devices under test, at the same time and only if a fail occurs does any evaluation have to be made. In the case of a failing pin on any device only that device with the falling pin is retested until passed or if not passed after a specified time the device is considered a fail.

REFERENCES:
patent: 5920573 (1999-07-01), Dorney
patent: 6043101 (2000-03-01), Stubblefield et al.
patent: 6061507 (2000-05-01), Fitzgerald et al.
patent: 6728652 (2004-04-01), Kobayashi
patent: 2002/0063556 (2002-05-01), Johnson et al.

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