Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
2009-04-03
2011-11-22
Phan, Huy Q (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
C324S602000, C324S605000, C324S609000, C324S072000, C324S072500, C333S012000, C333S245000
Reexamination Certificate
active
08063649
ABSTRACT:
A measuring system minimizes the parasitic affects of lumped circuit elements. The system includes two or more in-situ interfaces configured to conductively link a source to an internal load and an external load. The in-situ interfaces are linked to a shunt conductor. Two or more linear and dynamic elements conductively link the in-situ interfaces in series. The dynamic elements are configured to overwhelm the parasitic self-capacitance of an input circuit coupled to at least one of the in-situ interfaces. A shield enclosing at least one of the linear and dynamic elements has a conductive surface to fields and electromagnetic interference. The shield has attenuation ratios that substantially dampen the parasitic capacitance between the linear and dynamic elements that bridge some of the in-situ interfaces.
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Deibele Craig E.
Link George Brian
Peplov Vladimir V.
Brinks Hofer Gilson & Lione
Brown Lamarr
Phan Huy Q
UT-Battelle LLC
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