Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2007-11-20
2007-11-20
Stafira, Michael P. (Department: 2886)
Optics: measuring and testing
By polarized light examination
Reexamination Certificate
active
11315334
ABSTRACT:
A broadband ellipsometer/polarimeter system for analyzing a sample includes an illumination source emitting a polychromatic light beam, a polarization state generator (PSG) including a fixed linear polarizer and a substantially achromatic retarder mounted on a rotating holder, a sample holder, a polarization state analyser (PSA) including a fixed linear polarizer and a substantially achromatic retarder mounted on a rotating holder, a primary detection system measuring the intensities at each wavelength of the light beam transmitted through the PSA, optics to collimate the beam into the PSG and into the PSA and to focus the beam into the sample surface and the detector. The linear polarizer and achromatic retarder in the PSA are identical to those of the PSG but mounted in a reverse order.
REFERENCES:
patent: 5396329 (1995-03-01), Kalawsky
patent: 5706212 (1998-01-01), Thompson et al.
patent: 6141069 (2000-10-01), Sharp et al.
patent: 6552836 (2003-04-01), Miller
patent: 2005/0122514 (2005-06-01), Jang
Bennett, “A critical evaluation of Rhomb-type quarterwave retarders,”Applied Optics, vol. 9, No. 9, Sep. 1970, pp. 2123-2129.
Collins et al., “Advances in multichannel ellipsometric techjniques for in-situ and real-time characterization of thin films,”Thin Solid Films, vol. 38, No. 46, 2004, pp. 469-470.
Filinski et al., “Achromatic phase retarders constructed from right-angle prisms: design,”Applied Optics, vol. 23, No. 16, Aug. 15, 1984, pp. 2747-2751.
Compain et al., “Broadband division-of-amplitude polarimeter based on uncoated prisms,”Applied Optics, vol. 37, No. 25, Sep. 1, 1998, pp. 5938-5944.
Compain et al., “General and self-consistent method for the calibration of polarization modulators, polarimeters, and Mueller-matrix ellipsometers,”Applied Optics, vol. 38, No. 16, Jun. 1, 1999, pp. 3490-3502.
Goldstein, “Mueller matrix dual-rotating retarder polarimeter,”Applied Optics, vol. 31, No. 31, Nov. 1, 1992, pp. 6676-6683.
De Martino et al., “Optimized Mueller polarimeter with liquid crystals,”Optics Letters, vol. 28, No. 8, Apr. 15, 2003, pp. 616-618.
Nagib et al., “Optimization of a rhomb-type quarter-wave phase retarder,”Applied Optics, vol. 34, No. 16, Jun. 1, 1995, pp. 2927-2930.
Rochford et al., “Design and performance of a stable linear retarder,”Applied Optics, vol. 36, No. 25, Sep. 1, 1997, pp. 6458-6465.
Tyo, “Design of optimal polarimeters: maximization of signal-to-noise ratio and minimization of systematic error,”Applied Optics, vol. 41, No. 4, Feb. 1, 2002, pp. 619-630.
Sabatke, D.S. et al., “Optimization of retardance for a complete Stokes polarimeter”, Optics Letters, vol. 25, No. 11, Jun. 1, 2000, pp. 802-804, XP-02412779.
De Martino Antonello
Drevillon Bernard
Garcia-Caurel Enric
Ecole Polytechnique
Stafira Michael P.
LandOfFree
Broadband ellipsometer / polarimeter system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Broadband ellipsometer / polarimeter system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Broadband ellipsometer / polarimeter system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3806295