Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate
2011-01-11
2011-01-11
Toatley, Gregory J (Department: 2877)
Optics: measuring and testing
By particle light scattering
With photocell detection
C356S335000, C356S343000
Reexamination Certificate
active
07869038
ABSTRACT:
In one general aspect, a particle characterization instrument is disclosed that includes a first spatially coherent light source with a beam output aligned with an optical axis. A focusing optic is positioned along the optical axis after the coherent light source, and a sample cell is positioned along the optical axis after the focusing optic. The instrument also includes a diverging optic positioned along the optical axis after the sample cell, and a detector positioned outside of the optical axis to receive scattered light within a first range of scattering angles from the diverging optic. In another general aspect, an instrument can direct at least a portion of a first beam and at least a portion of a second beam along a same optical axis and a can receive scattered light from the sample cell resulting from interaction between the sample and either the first beam or the second beam.
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Jones Lewis
Lightfoot Nigel
Spriggs David
Stringfellow David
Elbing Kristofer E.
Malvern Instruments, Ltd.
Toatley Gregory J
Underwood Jarreas C
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