Broad-range ion mass spectrometer

Details Broad-range ion mass spectrometer Broad-range ion mass spectrometer

1978-03-15

1980-09-16

Anderson, Bruce C.

Radiant energy

With charged particle beam deflection or focussing

With detector

250398, 250292, H01J 314

Patent

active

042232236

ABSTRACT:
An essentially linear ion beam is derived from an ion emitting sample, inding a high-frequency mass filter of essentially linear ion beam path, the ion beam path extending towards an ion-electron converter of general rotation symmetrical shape with respect to an axis, the ion-electron converter having an axis aligned with the essentially linear ion beam path and including an electrode which has an aperture traversed by the beam from the source after having passed through the filter, the electrode having a secondary electron-emissive surface on a side thereof which is averted from the ion source and formed as a smoothly curved concave surface defining a converter chamber, the ions which have passed through the aperture being reflected back unto the secondary electron-emissive surface to then being detected by an electrode positioned within the converter chamber. Bias voltage sources bias the electrode with respect to the secondary electron-emissive surface to provide for reflection of ions on the secondary electron-emissive surface.

REFERENCES:
patent: 2264709 (1941-11-01), Nicoll
patent: 3176181 (1965-11-01), Blackler et al.
patent: 3376449 (1968-04-01), Harrison
patent: 3500042 (1970-03-01), Castaing et al.
patent: 3538328 (1970-11-01), Strausser
patent: 3973121 (1976-08-01), Fite et al.
patent: 4101771 (1978-07-01), Hofer et al.

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