Optics: measuring and testing – Refraction testing
Patent
1993-03-05
1995-08-29
Mintel, William
Optics: measuring and testing
Refraction testing
356326, 356328, 385 37, 385 43, 385130, G01N 2141
Patent
active
054465346
ABSTRACT:
A spectrometer for analyzing a sample of material utilizing a broad band source of electromagnetic radiation and a detector. The spectrometer employs a waveguide possessing an entry and an exit for the electromagnetic radiation emanating from the source. The waveguide further includes a surface between the entry and exit portions which permits interaction between the electromagnetic radiation passing through the wave guide and a sample material. A tapered portion forms a part of the entry of the wave guide and couples the electromagnetic radiation emanating from the source to the waveguide. The electromagnetic radiation passing from the exit of the waveguide is captured and directed to a detector for analysis.
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patent: 5208882 (1993-05-01), Strasser et al.
Radiation Fields of a Tapered Film and a Novel Film-To-Fiber Coupler-P. K. Tien; IEEE Transactions on Microwave Theory & Tech., vol. MTT-23, No. 1, Jan. 1975.
Integrated Optics-T. Tamir; Second Corrected & Updated Edition, 1979.
Mintel William
Optical Solutions, Inc.
Tran Minhloan
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