Bridgeless system for directly measuring complex impedance of an

Details Bridgeless system for directly measuring complex impedance of an Bridgeless system for directly measuring complex impedance of an

1990-04-05

1991-10-08

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324234, 324238, 324607, 324654, 364482, G01R 3312, G01R 2702, G01N 2790

Patent

active

050557840

ABSTRACT:
An all digital eddy current measurement system is described and illustrated in which an eddy current probe is driven by a driving signal and voltage signals representing the current through and voltage across the probe coil are used to calculate the magnitude and phase angle of a complex probe impedance. Digitization of the voltage signals is controlled by a control logic system which is run separately from but initiated by a microprocessor, the latter of which functions to analyze the acquired data and calculate impedance magnitude and phase angle values therefrom.

REFERENCES:
patent: 2535608 (1950-12-01), Smith
patent: 2595675 (1952-05-01), Jaynes
patent: 3159784 (1964-12-01), Haslett et al.
patent: 3234461 (1966-02-01), Trent et al.
patent: 3281681 (1966-10-01), Stevenson
patent: 3284705 (1966-11-01), Dobson
patent: 3434048 (1969-03-01), Law et al.
patent: 3619771 (1971-11-01), Hentschel
patent: 3970925 (1976-07-01), Procter et al.
patent: 3984768 (1976-10-01), Staples
patent: 4030026 (1977-06-01), Payne
patent: 4059795 (1977-11-01), Mordwinkin
patent: 4207520 (1980-06-01), Flora et al.
patent: 4230987 (1980-10-01), Mordwinkin
patent: 4303885 (1981-12-01), Davis et al.
patent: 4383218 (1983-05-01), Hansen et al.
patent: 4450405 (1984-05-01), Howard
patent: 4458196 (1984-07-01), Goyal et al.
patent: 4486713 (1984-12-01), Gifford
patent: 4495587 (1985-01-01), Plante et al.
patent: 4496904 (1985-01-01), Harrison
patent: 4506225 (1985-03-01), Loveless et al.
patent: 4556846 (1985-12-01), D'Hondt
patent: 4564809 (1986-01-01), Huschelrath et al.
patent: 4629985 (1986-12-01), Papadimitriou et al.
patent: 4651093 (1987-03-01), Detriche et al.
patent: 4672501 (1987-06-01), Bilac et al.
patent: 4763071 (1988-08-01), McGee et al.
patent: 4799011 (1989-01-01), Muller
Marvin et al., "Circuit for Remote Measurement of . . . or Admittance", Western Electric Tech. Digest, No. 14, Apr. 1969, pp. 11, 12.

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