Breakpoint compensation and thermal limit circuit

Details Breakpoint compensation and thermal limit circuit Breakpoint compensation and thermal limit circuit

1986-11-18

1988-12-06

Salce, Patrick R.

Electricity: power supply or regulation systems

Self-regulating

Using a three or more terminal semiconductive device as the...

323907, 307310, G05F 320

Patent

active

047898194

ABSTRACT:
A voltage reference circuit including a Brokaw Cell band-gap reference circuit is provided with breakpoint compensation to adjust the temperature coefficient of the reference voltage provided by the Brokaw Cell as a function of temperature. The voltage reference circuit also includes a thermal limit transistor which is biased by a voltage having a positive temperature coefficient. The thermal limit transistor draws a rapidly increasing current when the operating temperature reaches a predetermined value.

REFERENCES:
patent: 4325018 (1982-04-01), Schade, Jr.
patent: 4553048 (1985-11-01), Bynum et al.
patent: 4633165 (1986-12-01), Pietkiewicz et al.
"Linear Databook 1986", Linear Technology Corporation, pp. 3:13-3:24.
"Linear Integrated Circuits", National Semiconductor Corporation, Jan. 1974, pp. 1:18-1:20.
"Linear Databook", National Semiconductor Corporation, 1982 pp. 1:31-1:38.
Alan B. Grebene, "Bipolar And MOS Analog Integrated Circuit Design" John Wiley & Sons, 1984, pp. 170-187, 204-209, 261 and 495-509.
REF-01 Integrated Circuit, Precision Monolithics, Inc., schematic diagram.
Documents and facts relating to the LT 1070 Integrated Circuit, Linear Technology Corporation.

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