Break-away test probe

Details Break-away test probe Break-away test probe

1981-07-30

1984-11-06

Karlsen, Ernest F.

Electricity: measuring and testing

Testing potential in specific environment

Voltage probe

324158P, G01R 106

Patent

active

044814674

ABSTRACT:
A test probe for the testing of electrical circuits and circuit boards comprises a probe head (52) breakably coupled to an elongated probe arm (51). The breakable coupling is achieved by securing a first ring (63) to the probe arm and a second ring (60) to the probe head. The first and second rings may be respectively made of magnetic material and magnetizable material (or vice versa) thereby achieving a magnetic breakable coupling between the head and the arm. The probe head may comprise one or a plurality of probing pins (54,55) depending upon the type of circuit under test. The break-away feature of the test probe prevents any shearing of a solder connection as well as any damaging of the circuit boards, and/or of the probing pin or pins (FIG. 5).

REFERENCES:
patent: 1432003 (1922-10-01), West
patent: 2488328 (1949-11-01), Rider
patent: 2653297 (1953-09-01), Mohylowski
patent: 3358897 (1967-12-01), Christensen
patent: 3562643 (1971-02-01), Smith

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