Brazed solid material specimen holder for apparatus that measure

Details Brazed solid material specimen holder for apparatus that measure Brazed solid material specimen holder for apparatus that measure

1996-08-06

1998-10-06

Nguyen, Vinh P.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324654, 324637, G01R 2726

Patent

active

058182446

ABSTRACT:
Process for measuring dielectric and magnetic parameters of a solid material using a brazing or hard soldering of said material to a sample or specimen holder and apparatuses for performing said process.
According to the invention, a sample or specimen (2) of the material is brazed in an electrically conductive specimen holder (4, 6), which is installed in a measuring line (14), which is connected to a measuring apparatus (32) able to supply informations on the basis of which the parameters are calculated.
Application to the measurement of the dielectric permittivity and magnetic permeability of solid materials.

REFERENCES:
patent: 3398388 (1968-08-01), Chow
patent: 3622944 (1971-11-01), Tsuchiya
patent: 3873944 (1975-03-01), Vaguine et al.
patent: 4582240 (1986-04-01), Lux
patent: 4801862 (1989-01-01), Osaki
patent: 5209833 (1993-05-01), Foell
patent: 5403449 (1995-04-01), Farmer
patent: 5431328 (1995-07-01), Chang et al.
patent: 5532604 (1996-07-01), Nagata
IEEE Transactions on Instrumentation and Measurement, "Dielectric Characterization of Printed Circuit Boards Substrates", C. Heyward Riedell et al., vol. 39, No. 2, Apr. 1990, pp. 437-439.
Hewlett Packard Product Note No. 8510-3, "Measuring Dielectric Constant with the HP 8510 Network Analyser", pp. 1-11.
NASA Technical Memorandum 87628, "Effects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer", Edward R. Long, Jr., Langley Research Center, Hampton, Virginia, 1986.
Ceramic Bulletin, "Choice of Electrodes in Study and Use of Ceramic Semiconducting Oxides", H.A. Sauer and S.S. Flaschen, vol. 39, No. 6, 1960, pp. 304-306.
International Search Report--PCT/FR/01104--Feb. 7, 1994.
Hewlett Packard, "Measuring Dielectric Constant with the HP8510 Network Analyzer", Product Note No. 8510-3, pp. 1-11, 1985.

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