Boundary-scan test method and apparatus for diagnosing faults in

Details Boundary-scan test method and apparatus for diagnosing faults in Boundary-scan test method and apparatus for diagnosing faults in

1990-12-04

1993-11-09

Nguyen, Hoa T.

Excavating

371 151, G01R 3128, G06F 1100

Patent

active

052609472

ABSTRACT:
An apparatus for diagnosing faults in a device equipped with boundary-scan test capability stores serial test data upon detection of a fault in a device under test (DUT). Test data corresponding to a frame vector associated with the fault is formatted so that all information from parallel tester inputs and TAP scan registers can be simultaneously analyzed. A method for diagnosing faults is also disclosed.

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patent: 5130646 (1992-07-01), Kojima
patent: 5150048 (1992-09-01), McAuliffe et al.

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