Boundary-scan output cell with non-critical enable path

Details Boundary-scan output cell with non-critical enable path Boundary-scan output cell with non-critical enable path

1991-09-18

1994-06-07

Harvey, Jack B.

Excavating

371 221, 371 225, H04B 1700

Patent

active

053196465

ABSTRACT:
A boundary-scan output cell which includes critical data term and non-critical masking term paths without adding an extra layer of logic. The boundary-scan cell includes a multiplexer, a critical data path which transmits critical data terms, coupled to a first multiplexer input, a sampling circuit which transmits non-critical terms, term circuit coupled to a second multiplexer input, and a non-critical term path which transmits non-critical masking terms, coupled to the shift input of the multiplexer. Non-critical masking terms at the shift input are mimicked at the second input. Provision is also made for a test control circuit and a circuit for monitoring critical and non-critical terms.

REFERENCES:
patent: 4875003 (1989-10-01), Burke
patent: 5084874 (1992-01-01), Whetsel, Jr.
patent: 5103450 (1992-04-01), Whetsel
IEEE Std 1149.1-1990, "IEEE Standard Test Access Port and Boundary-Scan Architecture", May 21, 1990.
"A Standard Test Bus & Boundary Scan Architecture" by Lee Whetsel, TI Technical Journal, Jul.-Aug. 1988, pp. 48-59.

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