Boundary-scan enable cell with non-critical enable path

Details Boundary-scan enable cell with non-critical enable path Boundary-scan enable cell with non-critical enable path

1991-09-18

1994-09-13

Harvey, Jack B.

Excavating

371 221, 371 225, H04B 1700

Patent

active

053475208

ABSTRACT:
A boundary-scan enable cell which includes critical and non-critical enable paths without adding an extra layer of logic. The boundary-scan cell includes a multiplexer, a critical enable path which transmits critical enable terms coupled to a first multiplexer input, a sampling circuit which transmits non-critical terms coupled to a second multiplexer input, and a non-critical term path which transmits non-critical masking terms, coupled to the shift input of the multiplexer. Non-critical terms at the shift input are mimicked at the second input. Provision is also made for a test control circuit and a circuit for monitoring critical and non-critical terms.

REFERENCES:
patent: 4912709 (1990-03-01), Teske et al.
patent: 4961013 (1990-10-01), Obermeyer, Jr. et al.
patent: 5084874 (1992-01-01), Whetsel, Jr.
patent: 5103450 (1992-04-01), Whetsel
IEEE Std. 1149.1-1990, "IEEE Standard Test Access Port and Boundary-Scan Architecture", May 21, 1990.
"A Standard Test Bus & Boundary Scan Architecture" by Lee Whetsel, TI Technical Journal, Jul.-Aug. 1988, pp. 48-59.

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