Boundary scan cell for bi-directional input/output terminals

Details Boundary scan cell for bi-directional input/output terminals Boundary scan cell for bi-directional input/output terminals

1992-01-28

1993-06-15

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 223, G06F 1100

Patent

active

052202810

ABSTRACT:
A boundary scan cell is disclosed. Bi-directional input/output terminals are connected to bi-directional input/output terminals of a logic circuit subject to test in order to store test data or a test result in a first latch circuit, the output impedance of which changes depending on whether or not the bi-directional input/output terminals are in an input mode or in an output mode. As a result, holding of data is carried out by a static operation, and potential does not change with the lapse of time. Accordingly, there is no restriction on time in the operation for storing data, and erroneous operation is avoided.

REFERENCES:
patent: 4554664 (1985-11-01), Schultz
patent: 4833676 (1989-05-01), Koo
patent: 4870345 (1989-09-01), Tomioka et al.
patent: 4912709 (1990-03-01), Teske et al.
patent: 5042034 (1991-08-01), Correale, Jr. et al.

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