Boundary scan analysis

Details Boundary scan analysis Boundary scan analysis

2007-03-06

2007-03-06

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S119000

Reexamination Certificate

active

10769241

ABSTRACT:
A circuit testing approach involves the generation of boundary scan information using test vectors to identify characteristics of a circuit design and a boundary scan implementation therefor. According to an example embodiment of the present invention, test vectors are used in simulation to identify circuit design characteristics for establishing a boundary scan test program. The test vectors are generated using a netlist of the circuit design. The test vectors are used to simulate operation of the circuit, and responses to the simulation are detected and used to identify design-specific circuit characteristics and a boundary scan test program is generated using the design-specific circuit characteristics.

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