Boron doping by decaborane

Coating processes – Direct application of electrical – magnetic – wave – or... – Ion plating or implantation

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427527, 438515, 438918, C23C 1414

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active

060133325

ABSTRACT:
A method of manufacturing a semiconductor device comprising the steps of: ionizing decaborane; and implanting ionized decaborane into a silicon wafer. Solid decaborane can be vaporized in a reduced pressure atmosphere or by heating. A single decaborane molecule can provide 10 boron atoms while the acceleration energy per each boron atom can be reduced to about 1/10 of the acceleration energy for a decaborane molecule.

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"Shallow Junction Formation By Polyatomic Cluster Ion Implantation", by D. Takeuchi, N. Toyoda, N. Shimada, J. Matsuo and I. Yamada; Technical Report of IEIC, SDX 95-19G, pp. 83-89, Dec. 1995.

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