Bonding technique to join two or more silicon wafers

Adhesive bonding and miscellaneous chemical manufacture – Methods – Surface bonding and/or assembly therefor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

156 89, 165 801, 165 802, 165 803, 165146, 165185, B32B 3114

Patent

active

048549860

ABSTRACT:
A method of manufacturing semiconductors formed of bonded wafers. The method includes the use of a heat sink. The heat sink induces a temperature gradient to occur on a single area at the interface of the wafers with the gradient moving rapidly across the remaining surface. As a result of the temperature front, the voids or uncontacted areas between the wafers which result in a typical bonding process are substantially reduced, thereby providing a stronger and more effective bond.

REFERENCES:
patent: 2698273 (1954-12-01), Miner et al.
patent: 2893904 (1959-07-01), Dickson
patent: 2935666 (1960-05-01), Namen
patent: 3101114 (1963-08-01), Katz
patent: 3249680 (1966-05-01), Sheets et al.
patent: 3386503 (1968-06-01), Corning et al.
patent: 3823351 (1974-07-01), Chambers
patent: 3982992 (1976-09-01), Moffitt
patent: 4626206 (1986-12-01), McIntosh
patent: 4649990 (1987-03-01), Kurihara et al.
patent: 4682269 (1987-07-01), Pitasi

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Bonding technique to join two or more silicon wafers does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Bonding technique to join two or more silicon wafers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Bonding technique to join two or more silicon wafers will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-903620

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.