Bonding apparatus and method of bonding for a semiconductor...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Assembly of plural semiconductive substrates each possessing...

Reexamination Certificate

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Details

C438S120000, C438S613000, C257SE23021

Reexamination Certificate

active

07432129

ABSTRACT:
A method of bonding and a bonding apparatus for a semiconductor chip that apply ultrasonic vibration to the semiconductor chip to bond the semiconductor chip to a substrate carry out leveling effectively at low cost and in a short time and can improve the bonding between the semiconductor chip and the substrate. In a positioning step, bumps of the semiconductor chip and pads of the substrate are positioned and placed in contact. In a leveling step, ultrasonic vibration of a first predetermined frequency is applied to the semiconductor chip to make the bumps of the semiconductor chip and the pads of a substrate rub against each other to level the bumps. In a bonding step, ultrasonic vibration of a second predetermined frequency that differs to the first predetermined frequency is applied to the semiconductor chip to bond the bumps and pads of the semiconductor chip and the substrate.

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patent: 6793990 (2004-09-01), Sakaguchi et al.
patent: 2001/0033124 (2001-10-01), Norris et al.
patent: 2002/0115278 (2002-08-01), Kawai
patent: 2003/0151145 (2003-08-01), Hesse
patent: 2004/0041003 (2004-03-01), Higashiyama
patent: 2004/0229425 (2004-11-01), Yamaguchi et al.
patent: 10-284545 (1998-10-01), None
patent: 02002043355 (2002-02-01), None
patent: 02002043355 (2002-02-01), None

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