Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates
Reexamination Certificate
2007-08-31
2011-11-01
Bryant, Kiesha (Department: 2891)
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
C257S627000, C257S628000, C257SE21088, C438S459000
Reexamination Certificate
active
08048767
ABSTRACT:
A bonded wafer is produced by directly bonding a silicon wafer for active layer and a silicon wafer for support substrate without an insulating film and thinning the silicon wafer for active layer to a given thickness, in which a silicon wafer cut out from an ingot at a cutting angle of 0-0.1° (compound angle) with respect to a predetermined crystal face is used in each of the silicon wafer for active layer and silicon wafer for support substrate.
REFERENCES:
patent: 5451547 (1995-09-01), Himi et al.
patent: 5966625 (1999-10-01), Zhong et al.
patent: 6086670 (2000-07-01), Ito
patent: 6261928 (2001-07-01), Bruel
patent: 6645834 (2003-11-01), Akiyama
patent: 7153757 (2006-12-01), McCann et al.
patent: 7411274 (2008-08-01), Yamanaka et al.
patent: 2004/0087109 (2004-05-01), McCann et al.
patent: 2005/0101095 (2005-05-01), Fournel et al.
patent: 2005/0217560 (2005-10-01), Tolchinsky et al.
patent: 2006/0154442 (2006-07-01), de Souza et al.
patent: 2007/0215984 (2007-09-01), Shaheen et al.
patent: 2008/0164572 (2008-07-01), Toyoda et al.
patent: 05-211128 (1993-08-01), None
patent: 11-067701 (1999-03-01), None
M. Kittler et al., “Dislocation Engineering for a Silicon-Based Light Emitter at 1.5 μm”, International Electron Devices Meeting, IEEE, Piscataway, NJ, pp. 1-4, Dec. 5, 2005.
X. Yu et al., “Properties of dislocation networks formed by Si wafer direct bonding”, Materials Science in Semiconductor Processing, Elsevier Science Publishers B.V., Barking, UK, vol. 9, No. 1-3, pp. 96-101, Feb. 1, 2006.
European Search Report for Application No. 07016998.2-1235 dated Mar. 17, 2009.
Korean Office Action dated Sep. 29, 2008 (w/ English Translation of Relevant Parts).
Endo Akihiko
Morimoto Nobuyuki
Bryant Kiesha
Sughrue & Mion, PLLC
Sumco Corporation
Ward Eric
LandOfFree
Bonded wafer and method for producing bonded wafer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Bonded wafer and method for producing bonded wafer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Bonded wafer and method for producing bonded wafer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4297364