BJT with ESD self protection

Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure

Reexamination Certificate

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Details

C257S558000, C257S557000, C257S378000, C257S370000

Reexamination Certificate

active

11129957

ABSTRACT:
A ballasting region is placed between the base region and the collector contact of a bipolar junction transistor to relocate a hot spot away from the collector contact of the transistor. Relocating the hot spot away from the collector contact prevents the collector contact from melting during an electrostatic discharge (ESD) pulse.

REFERENCES:
patent: 5541433 (1996-07-01), Lien
patent: 5874767 (1999-02-01), Terashima et al.
patent: 6815732 (2004-11-01), Vashchenko et al.
patent: 6815800 (2004-11-01), Mallikarjunaswamy
patent: 7145206 (2006-12-01), Mallikarjunaswamy
patent: 2002/0158270 (2002-10-01), Yamamoto et al.
U.S. Appl. No. 10/821,287, filed Apr. 9, 2004, Vashchenko et al.
U.S. Appl. No. 11/060,877, filed Feb. 18, 2005, Vashchenko et al.
U.S. Appl. No. 10/649,989, filed Aug. 27, 2003, Vashchenko et al.
U.S. Appl. No. 10/650,000, filed Aug. 27, 2003, Vashchenko et al.

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