Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure
Reexamination Certificate
2007-05-22
2007-05-22
Smith, Zandra V. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Bipolar transistor structure
C257S558000, C257S557000, C257S378000, C257S370000
Reexamination Certificate
active
11129957
ABSTRACT:
A ballasting region is placed between the base region and the collector contact of a bipolar junction transistor to relocate a hot spot away from the collector contact of the transistor. Relocating the hot spot away from the collector contact prevents the collector contact from melting during an electrostatic discharge (ESD) pulse.
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Hopper Peter J.
Mirgorodski Yuri
Vashchenko Vladislav
National Semiconductor Corporation
Pickering Mark C.
Smith Zandra V.
Tran Thanh Y.
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