Bit error rate testing for high-speed devices

Details Bit error rate testing for high-speed devices Bit error rate testing for high-speed devices

2007-12-11

2007-12-11

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S066000, C702S125000, C702S079000, C714S055000, C375S226000

Reexamination Certificate

active

10868243

ABSTRACT:
A method and system for performing a bit error rate test on a device with substantial duty cycle output distortion are described herein.

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