Bit error rate measurement apparatus

Details Bit error rate measurement apparatus Bit error rate measurement apparatus

1995-02-09

1997-04-22

Nguyen, Hoa T.

Excavating

371 572, G06F 1100

Patent

active

056234970

ABSTRACT:
A bit error measurement apparatus is capable of easily specifying pattern conditions which cause bit errors in an incoming signal pattern without measuring all of a test pattern by measuring a bit error rate at a selected position or region of a test pattern. The bit error measurement apparatus includes a test pattern generator which generates the test pattern for verifying the incoming signal to be tested, a verifier which receives the incoming signal and the test pattern and generates a bit error detection signal when the incoming signal and the test pattern disagree, a pattern position detector which detects a measurement region of the test pattern when receiving a synchronizing signal from the test pattern generator and generates a count enable signal corresponding to the detected measurement region, and an error counter which counts the bit error detection signal from the verifier based on the count enable signal from the pattern position detector.

REFERENCES:
patent: 3851251 (1974-11-01), Wigner et al.
patent: 4385384 (1983-05-01), Rosbury et al.
patent: 5305323 (1994-04-01), Lada

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