Bit characteristics measurement system for digitally modulated s

Details Bit characteristics measurement system for digitally modulated s Bit characteristics measurement system for digitally modulated s

1996-10-11

1998-11-10

Chin, Wellington

Pulse or digital communications

Testing

Data rate

375224, 455410, 455415, H04B 1702

Patent

active

058355308

ABSTRACT:
System for measurement of the bit period (or bit rate or baud rate or symbol rate) and bit epoch (or symbol epoch) of a digitally modulated signal by extracting a bit time-of-transition array, determining an emphasis array with individual elements thereof relating to corresponding elements of the bit time-of-transition array, and using linear regression on the bit time-of-transition array with the emphasis. The emphasis array is formed from the signal amplitude, signal to interference ratio, or probability of a bit not being in error. One of several matched filters is dynamically selected based on the data content of the signal and used to detect bit transitions. The system has application in time varying multi-path fading environments. The system operates on signals with low SNR, high co-channel interference, or high intersymbol interference. Useful in transmitter identification, range finding, mobile transmitter location, and frequency hop intercept systems.

REFERENCES:
patent: 4559602 (1985-12-01), Bates, Jr.
patent: 5005210 (1991-04-01), Ferrell
patent: 5327144 (1994-07-01), Stilp et al.
patent: 5329591 (1994-07-01), Magrill
patent: 5369682 (1994-11-01), Witsaman
patent: 5448760 (1995-09-01), Frederick
patent: 5724389 (1997-12-01), Marko et al.

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