Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2011-01-25
2011-01-25
Smith, Bradley K (Department: 2894)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257SE29002, C438S102000, C438S103000, C365S163000, C365S001000
Reexamination Certificate
active
07875872
ABSTRACT:
A ferroelectric layer (104) is sandwiched between a lower electrode layer (103) and an upper electrode (105). When a predetermined voltage (DC or pulse) is applied between the lower electrode layer (103) and the upper electrode (105) to change the resistance value of the ferroelectric layer (104) to switch a stable high resistance mode and low resistance mode, a memory operation is obtained. A read can easily be done by reading a current value when a predetermined voltage is applied to the upper electrode (105).
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Jin Yoshito
Sakai Hideaki
Shimada Masaru
Blakely , Sokoloff, Taylor & Zafman LLP
Nippon Telegraph and Telephone Corporation
Smith Bradley K
Valentine Jami M
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