Optics: measuring and testing – Material strain analysis – With polarized light
Patent
1995-10-19
1997-12-02
Rosenberger, Richard A.
Optics: measuring and testing
Material strain analysis
With polarized light
73800, 356365, G01L 124
Patent
active
056942052
ABSTRACT:
A birefringent bias is provided to an optical sensor by the addition of one or more single birefringent elements where the total birefringence-length product remains within the accepted tolerances of current devices. The bias provided by two or more elements is such that where each element has a birefringence, a dB/dT and a coefficient of thermal expansion term, the elements are arranged in tandem so that the combined birefringence terms equal the required birefringence bias and the dB/dT and coefficient of thermal expansion terms effectively cancel.
REFERENCES:
patent: 4321831 (1982-03-01), Tomlinson et al.
patent: 5255068 (1993-10-01), Emo et al.
patent: 5561522 (1996-10-01), Rapoport et al.
Gualtieri Devlin M.
Hou Janpu
Rapoport William R.
Van de Vaart Herman
Allied-Signal Inc.
Kreger, Jr. Verne E.
Rosenberger Richard A.
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