Birefringence profiler

Details Birefringence profiler Birefringence profiler

2008-01-08

2008-01-08

Nguyen, Tu T (Department: 2886)

Optics: measuring and testing

For optical fiber or waveguide inspection

Reexamination Certificate

active

07317517

ABSTRACT:
A waveguide under test can be exposed to a light signal whose polarization rotates between the vertical and horizontal polarizations. The intensity detected at a photodetector can be separated into AC and DC components. The AC components may be utilized to derive a characteristics which is indicative of birefringence of the waveguide. If the light signal is scanned over the waveguide under test, a measure of the birefringence at each position along the waveguide may be determined.

REFERENCES:
patent: 6678433 (2004-01-01), Kim et al.
patent: 6856391 (2005-02-01), Garab et al.
patent: 6856710 (2005-02-01), Wein et al.
patent: 2003/0081196 (2003-05-01), Geiler et al.
patent: 2000-329651 (2000-11-01), None

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