Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate
2008-06-10
2008-06-10
Punnoose, Roy M (Department: 2886)
Optics: measuring and testing
By polarized light examination
With birefringent element
C356S364000
Reexamination Certificate
active
07385696
ABSTRACT:
Provided are methods for determining the birefringence level of optical material such as polymeric film. In one embodiment, the method uses a setup of optical components that has known system reference angle. The sample may be a stretched polymeric film that has a fast axis angle that has a predetermined orientation in the sample. The system is operated to align the direction of the fast axis of the sample with the reference angle of the system and to measure the birefringence level at a location of the sample. As one aspect of the invention, embodiments and methods are described for accurately determining birefringence levels across a very wide range and up to tens of thousands of nanometers.
REFERENCES:
patent: 5521705 (1996-05-01), Oldenbourg et al.
patent: 6473179 (2002-10-01), Wang
patent: 6985227 (2006-01-01), Wang
patent: 2004/0233434 (2004-11-01), Wang
Hancock Hughey LLP
Hinds Instruments, Inc.
Punnoose Roy M
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