Birefringence characteristic measuring method, optical...

Details Birefringence characteristic measuring method, optical... Birefringence characteristic measuring method, optical...

2007-05-17

2009-06-02

Young, Wayne R (Department: 2627)

Dynamic information storage or retrieval

Specific detail of information handling portion of system

Radiation beam modification of or by storage medium

C369S275500, C369S283000, C369S286000, C369S288000

Reexamination Certificate

active

07542401

ABSTRACT:
Four types of optical systems, a polarization optical system including an objective lens having a high numerical aperture, a polarization optical system including an objective lens having a low numerical aperture, a non-polarization optical system including an objective lens having a high numerical aperture and a non-polarization optical system including an objective lens having a low numerical aperture, are selectively used at the time of irradiating light from a semiconductor laser on a target disk for measurement, and the in-plane birefringence characteristic and perpendicular birefringence characteristic of the target disk are separately acquired based on the amounts of received light obtained by measuring reflected light from the target disk by a photosensor.

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