Bipolar transistor with ultra-thin epitaxial base and method of

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357 59, 357 54, H01L 2972, H01L 2904, H01L 2934

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active

051012561

ABSTRACT:
A method of forming a bipolar transistor is provided, comprising the steps of: providing a semiconductor substrate including a first region of a first conductivity type; forming a layer of insulative material over a surface of the first region; forming a layer of conductive material over the layer of insulative material; patterning the first and second layers to form a generally vertical sidewall bounding an exposed portion of the first region surface; and epitaxially depositing a base region of a second conductivity type over the exposed portion of the first region surface and the sidewall such that the base region is in electrical contact with the second region.

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T104,102 Defensive Publication, by A. P. Ho et al., Apr. 3, 1984, "Polysilicon-Base Self-Aligned Bipolar Transistor Process and Structure", Filed Apr. 22, 1982.
IBM Technical Disclosure Bulletin, vol. 22, No. 12, May 1980 by A. P. Ho et al, Self-Aligned Process for Forming Metal-Silicide and Polysilicon Composite Base Contact, pp. 5336-5338.
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IBM Technical Disclosure Bulletin, vol. 22, No. 5, Oct. 1979 by N. H. Ning et al., Bipolar Transistor Structure with Extended Metal Base Contacts and Diffused or Implanted Emitter, pp. 2123-2126.

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